Structural

Photography by Markus Schäfer

Twenty-One Semiconductors uses a number of characterization methods such as electron scanning microscopy, atomic force microscopy and X-ray diffraction to ensure the fabrication of high-quality semiconductor structures. We also offer these methods as a service, giving you maximum insight and understanding of your own processes and structures.

Electro-Optical

Photography by Susanne Weidenfeld

Photoluminescence and reflectivity measurements on semiconductors as well as electro-optical characterization of lasers is our daily business. Let us support you by analyzing your structures and devices in order to enhance their performances.

Cryogenic

Using liquid helium allows us to perform measurements at cryogenic temperatures down to 4 Kelvin, which can provide valuable information on the material properties and electro-optical characteristics of semiconductors. Are you interested in a detailed analysis of your semiconductor structures?